• DocumentCode
    1494817
  • Title

    Measurements of Charge Transfer Inefficiency in a CCD With High-Speed Column Parallel Readout

  • Author

    Sopczak, André ; Bekhouche, Khaled ; Damerell, Chris ; Greenshaw, Tim ; Koziel, Michal ; Stefanov, Konstantin ; Tikkanen, Tuomo ; Woolliscroft, Tim ; Worm, Steve

  • Author_Institution
    Lancaster Univ., Lancaster, UK
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • Firstpage
    2925
  • Lastpage
    2930
  • Abstract
    Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) collaboration is developing Column-Parallel CCDs (CPCCDs) for the vertex detector of a future Linear Collider. The CPCCDs can be read out many times faster than standard CCDs, significantly increasing their operating speed. A test stand for measuring the charge transfer inefficiency (CTI) of a prototype CPCCD has been set up. Studies of the CTI have been performed at a range of readout frequencies and operating temperatures.
  • Keywords
    charge exchange; charge-coupled devices; position sensitive particle detectors; readout electronics; semiconductor counters; charge transfer inefficiency; column-parallel charge coupled devices; high energy physics; high-speed column parallel readout; linear collider flavour identification collaboration; readout frequencies; spatial resolution; thin sensitive layers; vertex detector; Charge coupled devices; Charge measurement; Charge transfer; Charge-coupled image sensors; Collaboration; Current measurement; Detectors; Prototypes; Spatial resolution; Testing; Charge traps; data analysis; detectors; particle detectors; particle tracking; radiation damage; radiation effects in devices; semiconductor device radiation effects; signal analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2026648
  • Filename
    5280547