• DocumentCode
    1494818
  • Title

    On an Electroless Plating (EP)-Based Pd/AlGaN/GaN Heterostructure Field-Effect Transistor (HFET)-Type Hydrogen Gas Sensor

  • Author

    Huang, Chien-Chang ; Chen, Huey-Ing ; Chen, Tai-You ; Hsu, Chi-Shiang ; Chen, Chun-Chia ; Chou, Po-Cheng ; Liou, Jian-Kai ; Liu, Wen-Chau

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • Volume
    33
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    788
  • Lastpage
    790
  • Abstract
    A Pd/AlGaN/GaN heterostructure field-effect transistor (HFET)-type hydrogen gas sensor, based on the sensitization, activation, and electroless plating (EP) deposition processes, is fabricated and studied. Due to the used sensitization and activation approaches, a dense and uniform EP seed layer could be achieved. Good dc and microwave characteristics, including the higher turn-on voltage, lower reverse leakage current, improved thermal stability of drain current, enhanced unity current gain cutoff frequency, and maximum oscillation frequency, are obtained for a 1-m-gate-length device. Moreover, the significant hydrogen gas sensing performance, such as larger drain current variation and higher hydrogen detection sensitivity, are found under 1% and 5 ppm H2/air ambiences, respectively. Consequently, the studied EP-based Pd/AlGaN/GaN HFET gives the promise for high-performance electronic device and hydrogen gas sensor applications.
  • Keywords
    aluminium compounds; electrodeposition; gallium compounds; gas sensors; high electron mobility transistors; hydrogen; palladium; semiconductor device manufacture; thermal stability; H; Pd-AlGaN-GaN; activation processes; drain current; electroless plating deposition processes; heterostructure field-effect transistor-type gas sensor; high-performance electronic device; higher turn-on voltage; lower reverse leakage current; maximum oscillation frequency; sensitization processes; size 1 m; thermal stability; unity current gain cutoff frequency; Aluminum gallium nitride; Gallium nitride; Gas detectors; HEMTs; Logic gates; MODFETs; Temperature measurement; Activation; electroless plating (EP); heterostructure field-effect transistor (HFET); hydrogen; sensitization; sensor;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2190032
  • Filename
    6183459