DocumentCode :
1495106
Title :
Rebuttal To: A Critique Of The Reliability-analysis-center Failure-rate-model For Plastic Encapsulated Microcircuits
Author :
Denson, William K.
Author_Institution :
Reliability Analysis Center, Rome
Volume :
47
Issue :
4
fYear :
1998
Firstpage :
419
Lastpage :
424
Keywords :
Costs; Failure analysis; Feedback; Life estimation; Performance analysis; Physics; Plastics; Predictive models; Reliability engineering; Uncertainty;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1998.756084
Filename :
756084
Link To Document :
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