• DocumentCode
    1495127
  • Title

    A revised layered-network algorithm to search for all d-minpaths of a limited-flow acyclic network

  • Author

    Yeh, Wei-Chang

  • Author_Institution
    Feng Chia Univ., Taichung, Taiwan
  • Volume
    47
  • Issue
    4
  • fYear
    1998
  • fDate
    12/1/1998 12:00:00 AM
  • Firstpage
    436
  • Lastpage
    442
  • Abstract
    Many real-world systems are multistate and composed of multistate components in which the reliability can be computed in terms of the lower bound points of level d, called d-minpaths (d-MP). Such systems (electric power, transportation, etc.) may be regarded as flow networks whose arcs have statistically independent, discrete, limited and multivalued random capacities. This study focuses on how to find the entire path of d-MP before calculating the reliability of an acyclic network. Analysis of the authors´ “revised layered network algorithm” (RLNA) and comparison to existing algorithms show that RLNA has the advantages: (1) it can be used to search for all MP, an NP-hard problem that is assumed to be known in advance in the existing algorithms; (2) the original NP-hard problem can be decomposed into several smaller subproblems using the RLNA such that the d-MP candidates are simple to find and verify, which is more effective than the existing methods; and (3) RLNA is easier to understand and implement. This paper first develops the intuitive RLNA. The computational complexity of RLNA is then analyzed and compared with existing methods. An example illustrates how all d-MP are generated
  • Keywords
    failure analysis; nonlinear programming; reliability theory; computational complexity; d-minpaths; limited-flow acyclic network reliability; lower bound points; nonlinear programming; reliability analysis; revised layered-network algorithm; Algorithm design and analysis; NP-hard problem; Power supplies; Power system reliability; Stress; Transportation;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.756087
  • Filename
    756087