A tool for hierarchical test generation

Author

Krüger, Gerd

Author_Institution

Nixdorf Comp. AG, Paderborn, Germany

Volume

10

Issue

4

fYear

1991

fDate

4/1/1991 12:00:00 AM

Firstpage

519

Lastpage

524

Abstract

An extended system MSST (MIMOLA software system test generator), and its algorithms for automatic test generation are presented. In a hierarchical, mixed-level approach (from gate to system level) test patterns for sequential circuits and test programs for external testing or self-testing (diagnostics) of microprocessor boards or processor systems can be generated automatically. In a complete hierarchy lower bounds for test coverage are easily computable. The MIMOLA design system (including MSST) has been installed on VAX, APOLLO, SUN, and several other host machines. Several production line test applications show good results

Keywords

automatic testing; circuit CAD; logic CAD; logic testing; sequential circuits; APOLLO; MIMOLA design system; MSST; SUN; VAX; automatic test generation; external testing; hierarchical test generation; microprocessor boards; mixed level test patterns; processor systems; self-testing; sequential circuits; software system test generator; test programs; Automatic testing; Built-in self-test; Circuit testing; Microprocessors; Sequential analysis; Sequential circuits; Software algorithms; Software systems; Software testing; System testing;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.75635

Filename

75635