• DocumentCode
    1495602
  • Title

    An inverse technique to evaluate permittivity of material in a cavity

  • Author

    Thakur, Kailash P. ; Holmes, Wayne S.

  • Author_Institution
    Imaging & Sensing Team, Ind. Res. Ltd., Auckland, New Zealand
  • Volume
    49
  • Issue
    6
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    1129
  • Lastpage
    1132
  • Abstract
    A numerical technique to estimate the dielectric constant and loss factor of a homogeneous dielectric material placed in an arbitrary shaped cavity has been developed. The values of S-parameters are measured experimentally by placing the sample in the cavity. Starting with a trial set of permittivity values, the computation is carried out using the finite-element method (FEM) to match the S-parameters around the fundamental resonance frequency. The FEM routine is run several times while optimizing the values of dielectric constant and conductivity of the sample. During the process of optimization, eight different measures of error between computed and experimental values of complex S-parameters are examined. It is found that there is no single measure of error, which can be minimized to estimate two parameters (dielectric constant and the loss factor), but the combination of errors has to be minimized to get the exact solution. The computer program can generate the solution with an accuracy of less than 0.01% in a few hours on a Pentium-based personal computer
  • Keywords
    Monte Carlo methods; S-parameters; cavity resonators; dielectric losses; errors; finite element analysis; inverse problems; iterative methods; optimisation; permittivity; FEM; arbitrary shaped cavity; complex S-parameters; computer program; dielectric constant; error minimisation; finite-element method; fundamental resonance frequency; homogeneous dielectric material; inverse technique; loss factor; material permittivity evaluation; measured S-parameters; numerical technique; optimization; Computer errors; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Finite element methods; Permittivity measurement; Resonance; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.925502
  • Filename
    925502