DocumentCode :
1495687
Title :
Nitrogen doping effect in Ag-SbTe solid electrolyte for programmable metallisation cell memory
Author :
Young-Sam Park ; Seung-Yun Lee ; Moongyu Jang ; Sung-Min Yoon
Author_Institution :
ETRI, Daejeon, South Korea
Volume :
48
Issue :
8
fYear :
2012
Firstpage :
458
Lastpage :
460
Abstract :
Solid electrolytes with a small on-state resistance enable a large read margin and high speed for programmable metallisation cell memory devices. It has been believed that the increase of control current is the only effective method of on-state resistance reduction, but it does not reflect a requirement for low power consumption. Proposed is a new approach to reduce on-state resistance while maintaining the control current. It was found that nitrogen doping into the SbTe chalcogenide glass, constituting solid electrolytes, decreased on-state resistance and stabilised the switching characteristics of the fabricated devices. The nitrogen-doped SbTe chalcogenide glass formed into the solid electrolyte of a small thickness, which resulted in reduced on-state resistance.
Keywords :
antimony compounds; chalcogenide glasses; semiconductor device metallisation; semiconductor doping; semiconductor storage; silver compounds; solid electrolytes; Ag-SbTe; Ag-SbTe solid electrolyte; N; SbTe chalcogenide glass; control current; nitrogen doping effect; on-state resistance reduction; programmable metallisation cell memory; switching characteristic;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.0308
Filename :
6183721
Link To Document :
بازگشت