Title :
Designing optimal image feature detection masks: equal area rule
Author_Institution :
Dept. of Phys., London Univ., UK
fDate :
3/18/1999 12:00:00 AM
Abstract :
The problem of designing optimal templates for detecting image features is discussed. An equal area rule is derived which reduces the uncertainty involved when masks with a large number of free parameters have to be designed.
Keywords :
image recognition; equal area rule; free parameters; image feature detection masks; optimal templates; uncertainty;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990358
