DocumentCode :
1495832
Title :
Josephson terahertz local oscillator
Author :
Robertazzi, R.P. ; Buhrman, R.A.
Author_Institution :
Sch. of Appl. & Eng. Phys., Cornell Univ., Ithaca, NY, USA
Volume :
25
Issue :
2
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
1384
Lastpage :
1387
Abstract :
Voltage-tunable Josephson junction terahertz oscillators have been fabricated using rugged, high-current-density NbN1-xCx tunnel junctions with M O barriers. The radiation emitted from such junctions is detected on chip by a second Josephson junction which is capacitively coupled to the first. For oscillator junctions with a critical current density of Jc~3.5×104 A/cm2 the junction oscillates with a voltage amplitude of ≈1.5 mV. The detected RF voltage level remain essentially constant from 300 GHz to above 1 THz, the upper limit of the detector. From measurements of the Josephson step height in the detector current-voltage characteristics, it is determined that the oscillator junction produces 0.5 μW of terahertz radiation of which, due to impedance mismatch, 10 nW is coupled into the detector junction
Keywords :
Josephson effect; critical current density (superconductivity); equivalent circuits; microwave oscillators; solid-state microwave circuits; solid-state microwave devices; submillimetre wave devices; superconducting junction devices; tuning; variable-frequency oscillators; 0.5 muW; 300 GHz to 1 THz; Josephson junction; Josephson step height; M O barriers; NbN1-xCx tunnel junctions; NbN1-xCx-MgO; THF; VFO; critical current density; detector current-voltage characteristics; generator-detector device; high-current-density; impedance mismatch; microwave device; submillimetre wave operation; terahertz local oscillator; voltage-tunable LO; Critical current density; Current measurement; Impedance measurement; Josephson junctions; Local oscillators; Radiation detectors; Radio frequency; Submillimeter wave measurements; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92553
Filename :
92553
Link To Document :
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