A probabilistic model for the response of an electrically short two-conductor transmission line driven by a random plane wave field

A probabilistic approach for the characterization of wiring-harness susceptibility to external interference is presented. The problem of field-coupling onto a uniform, lossless, electrically-short two-conductor transmission line loaded by terminal resistances is considered. The external field is modeled as a plane wave with random parameters. By virtue of the low-frequency assumption, the statistical properties of the induced current magnitude in one of the line loads are derived, for different characterizations of the external wave. Investigated configurations include: waves with random amplitude, waves with random amplitude and polarization, waves with random amplitude and direction of incidence, and waves with random amplitude, polarization and direction of incidence. Analytical expressions for the probability density function of the current (voltage) induced in one of the line loads are derived. The proposed model allows the computation of statistical parameters of interest, such as expected values, variances, and confidence intervals of the currents (voltages) in the line loads