• DocumentCode
    14959
  • Title

    Simulation Study of Germanium p-Type Nanowire Schottky Barrier MOSFETs

  • Author

    Jaehyun Lee ; Mincheol Shin

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    34
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    342
  • Lastpage
    344
  • Abstract
    Ambipolar currents in germanium p-type nanowire Schottky barrier (SB) metal-oxide-semiconductor field-effect transistors were calculated fully quantum mechanically by using the multiband k ·p method and the nonequilibrium Green´s function approach. We investigated the performance of devices with [100], [110], and [111] channel orientations, respectively, by varying the nanowire width, SB height, and equivalent oxide thickness (EOT). The [111]-oriented devices showed the best performance. In comparison to Si as a channel material, Ge is more desirable because more current can be injected into the channel, resulting in steeper subthreshold swing and higher on-state current. Our calculations predict that the Ge channel devices should have an EOT gain of 0.2-0.5 nm over Si channel devices.
  • Keywords
    Green\´s function methods; MOSFET; Schottky barriers; elemental semiconductors; germanium; nanowires; EOT; Ge; ON-state current; SB; Si channel device; [111]-oriented device; ambipolar current; channel material; equivalent oxide thickness; metal-oxide-semiconductor field-effect transistor; multiband k-p method; nonequilibrium Green\´s func- tion approach; p-type nanowire Schottky barrier MOSFET; quantum mechanics; size 0.2 nm to 0.5 nm; steeper subthreshold swing; Effective mass; Logic gates; MOSFETs; Performance evaluation; Schottky barriers; Silicon; $k cdot p$ method; Germanium; Schottky barriers (SBs); hole transport; metal–oxide–semiconductor field-effect transistors (MOSFETs); nanowire; nonequilibrium Green\´s function; p-type MOSFETs;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2237375
  • Filename
    6414591