Passive signal processing of in-line fiber etalon sensors for high strain-rate loading

Author

Lo, Yun-lung ; Sirkis, James S. ; Chang, Chia-Chen

Author_Institution

Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

Volume

15

Issue

8

fYear

1997

fDate

8/1/1997 12:00:00 AM

Firstpage

1578

Lastpage

1586

Abstract

This paper describes the development of a passively demodulated optical fiber sensor system capable of accommodating the high strain-rate events commonly encountered in applications involving stress wave propagation. This sensor system, which is based on in-line fiber etalon (ILFE) sensors and path-matched differential interferometry (PMDI), was tested experimentally at low frequency and strain-rates (time derivative of strain) up to (~10⁷ με/s). For the present system, this strain-rate corresponds to a sensor phase bandwidth of approximately 100 kHz. Characterization tests using sensor gauge lengths ranging from 260 to 350 μm showed that the sensor system had a minimum detectable phase of ~2 microrad/√HZ rms at 2 kHz which corresponds to ~0.8 nε/√Hz rms for 260 μm-gauge length sensor

Keywords

deformation; fibre optic sensors; light interferometry; optical information processing; strain measurement; strain sensors; μm-gauge length sensor; 260 to 350 mum; characterization tests; high strain-rate events; high strain-rate loading; in-line fiber etalon sensors; minimum detectable phase; passive signal processing; passively demodulated optical fiber sensor system; path-matched differential interferometry; sensor gauge lengths; sensor phase bandwidth; sensor system; strain-rates; stress wave propagation; Optical fiber sensors; Optical fiber testing; Optical interferometry; Optical propagation; Optical signal processing; Sensor phenomena and characterization; Sensor systems; Signal processing; Stress; System testing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.618393

Filename

618393