DocumentCode :
1496031
Title :
Bit error rates for ultrafast APD based optical receivers: exact and large deviation based asymptotic approaches
Author :
Sun, Peng ; Hayat, Majeed M. ; Das, Abhik K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of New Mexico, Albuquerque, NM, USA
Volume :
57
Issue :
9
fYear :
2009
fDate :
9/1/2009 12:00:00 AM
Firstpage :
2763
Lastpage :
2770
Abstract :
Exact analysis as well as asymptotic analysis, based on large-deviation theory (LDT), are developed to compute the bit-error rate (BER) for ultrafast avalanche-photodiode (APD) based optical receivers assuming on-off keying and direct detection. The effects of intersymbol interference (ISI), resulting from the APD´s stochastic avalanche buildup time, as well as the APD´s dead space are both included in the analysis. ISI becomes a limiting factor as the transmission rate approaches the detector´s bandwidth, in which case the bit duration becomes comparable to APD´s avalanche buildup time. Further, the effect of dead space becomes significant in high-speed APDs that employ thin avalanche multiplication regions. While the exact BER analysis at the generality considered here has not been reported heretofore, the asymptotic analysis is a major generalization of that developed by Letaief and Sadowsky [IEEE Trans. Inform. Theory, vol. 38, 1992], in which the LDT was used to estimate the BER assuming APDs with an instantaneous response (negligible avalanche buildup time) and no dead space. These results are compared with those obtained using the common Gaussian approximation approach showing the inadequacy of the Guassian approximation when ISI noise has strong presence.
Keywords :
avalanche photodiodes; error statistics; intersymbol interference; optical communication; optical receivers; photodetectors; BER analysis; ISI noise; asymptotic analysis; bit duration; bit error rate; exact analysis; intersymbol interference; large-deviation theory; optical communication; optical receiver; stochastic avalanche buildup time; transmission rate; ultrafast APD; ultrafast avalanche-photodiode; Avalanche photodiodes; Bit error rate; Electron optics; High speed optical techniques; Intersymbol interference; Optical noise; Optical receivers; Stochastic processes; Sun; Ultrafast optics; Optical communication, avalanche photodiodes, optical receivers, optoelectronic devices, error analysis, large deviation principle.;
fLanguage :
English
Journal_Title :
Communications, IEEE Transactions on
Publisher :
ieee
ISSN :
0090-6778
Type :
jour
DOI :
10.1109/TCOMM.2009.09.080056
Filename :
5281765
Link To Document :
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