DocumentCode
1496272
Title
A rule-based design-for-testability rule checker
Author
Bidjan-Irani, Mehrdad
Author_Institution
Paderborn Univ., Germany
Volume
8
Issue
1
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
50
Lastpage
57
Abstract
An automatic design-for-testability (DFT) rule checker that can be used during early design stages at the register-transfer level is described. The system uses expert-system technology to check the correspondence of a rule set to a register-transfer level description of the design. In addition, it runs quickly and interactively, supports hierarchical design by checking subcircuits and groups of subcircuits, and provides concrete references about possible rule violations in the circuit and advice on how to eliminate them. The system accepts arbitrary DFT rule sets as input and analyzes highly integrated circuits hierarchically. Its output provides the location of rule violations or, if there are no violations, DFT descriptions of the circuit and the analysis protocol.<>
Keywords
automatic testing; expert systems; logic CAD; analysis protocol; automatic testing; expert-system technology; hierarchical design; highly integrated circuits; register-transfer level; rule violations; rule-based design-for-testability rule checker; Automatic control; Automatic testing; Circuit synthesis; Circuit testing; Clocks; Design for testability; Logic testing; Production; Sequential analysis; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.75663
Filename
75663
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