• DocumentCode
    1496272
  • Title

    A rule-based design-for-testability rule checker

  • Author

    Bidjan-Irani, Mehrdad

  • Author_Institution
    Paderborn Univ., Germany
  • Volume
    8
  • Issue
    1
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    50
  • Lastpage
    57
  • Abstract
    An automatic design-for-testability (DFT) rule checker that can be used during early design stages at the register-transfer level is described. The system uses expert-system technology to check the correspondence of a rule set to a register-transfer level description of the design. In addition, it runs quickly and interactively, supports hierarchical design by checking subcircuits and groups of subcircuits, and provides concrete references about possible rule violations in the circuit and advice on how to eliminate them. The system accepts arbitrary DFT rule sets as input and analyzes highly integrated circuits hierarchically. Its output provides the location of rule violations or, if there are no violations, DFT descriptions of the circuit and the analysis protocol.<>
  • Keywords
    automatic testing; expert systems; logic CAD; analysis protocol; automatic testing; expert-system technology; hierarchical design; highly integrated circuits; register-transfer level; rule violations; rule-based design-for-testability rule checker; Automatic control; Automatic testing; Circuit synthesis; Circuit testing; Clocks; Design for testability; Logic testing; Production; Sequential analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.75663
  • Filename
    75663