Title :
A Bayesian predictive software reliability model with pseudo-failures
Author :
Pham, Loan ; Pham, Hoang
Author_Institution :
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
fDate :
5/1/2001 12:00:00 AM
Abstract :
In our previous paper (2000), a Bayesian software reliability model with stochastically decreasing hazard rate was presented. Within any given failure time interval, the hazard rate is a function of both total testing time as well as number of encountered encountered failures. In this paper, to improve the predictive performance of our previously proposed model, a pseudo-failure is inserted whenever there is a period of failure-free execution equals (1-α)th percentile of the predictive distribution for time until the next failure has passed. We apply the enhanced model with pseudo-failures inserted to actual software failure data and show it gives better results under the sum of square errors criteria compared to previous Bayesian models and other existing times between failures models
Keywords :
Bayes methods; Weibull distribution; failure analysis; reliability theory; software reliability; Bayesian predictive model; Weibull distribution; hazard rate; likelihood ratios; pseudo-failures; software reliability; testing time; time between failures; Bayesian methods; Computer errors; Computer industry; Hazards; Maximum likelihood estimation; Predictive models; Software quality; Software reliability; Software testing; Weibull distribution;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/3468.925663