Title :
Reliability for Networked Storage Nodes
Author :
Rao, KK ; Hafner, James Lee ; Golding, Richard A.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
High-end enterprise storage has traditionally consisted of monolithic systems with customized hardware, multiple redundant components and paths, and no single point of failure. Distributed storage systems realized through networked storage nodes offer several advantages over monolithic systems such as lower cost and increased scalability. In order to achieve reliability goals associated with enterprise-class storage systems, redundancy will have to be distributed across the collection of nodes to tolerate both node and drive failures. In this paper, we present alternatives for distributing this redundancy, and models to determine the reliability of such systems. We specify a reliability target and determine the configurations that meet this target. Further, we perform sensitivity analyses, where selected parameters are varied to observe their effect on reliability.
Keywords :
distributed memory systems; fault tolerance; redundancy; distributed storage system; high-end enterprise storage; monolithic system; multiple redundant component; networked storage node reliability; Cache storage; Costs; Drives; Fabrics; Fault tolerant systems; Hardware; Production systems; Redundancy; Scalability; Sensitivity analysis; Mass storage; distributed systems.; fault tolerance; modeling techniques; redundant design;
Journal_Title :
Dependable and Secure Computing, IEEE Transactions on
DOI :
10.1109/TDSC.2010.21