Title :
Noise-Like Sequences to Resonant Excite the Writing of a Universal Memory Based on Spin-Transfer-Torque MRAM
Author :
Carpentieri, Mario ; Ricci, Marco ; Burrascano, Pietro ; Torres, Luis ; Finocchio, Giovanni
Author_Institution :
Dept. of Elettron., Inf. e Sist., Univ. of Calabria, Rende, Italy
Abstract :
The effects of a noise-like weak signal in the resonant switching of the magnetization driven by spin transfer torque have been systematically studied by means of micromagnetic simulations in both in-plane spin valves and out-of-plane magnetic tunnel junctions. The use of a noise-like resonant excitation allows the overpassing of some critical points compared to the traditional microwave assisted switching. In particular, the application of binary spreading sequences (BSS) does not require the precise knowledge of the resonant frequency and of the optimum relative phase, allowing the use of the same resonant excitation for all the devices in a matrix of memory cells, even if small variations of the physical and geometrical parameters are present. In addition, we also found that in spin valves the switching probabilities close to 100% can be achieved with a smaller current pulse, and in magnetic tunnel junctions a significant energy saving can be obtained.
Keywords :
MRAM devices; magnetic switching; magnetic tunnelling; magnetisation; micromagnetics; spin valves; MRAM; binary spreading sequence; critical points; energy saving; geometrical properties; in-plane spin valves; magnetic tunnel junctions; magnetization; magnetoresistive random access memory; memory cells; micromagnetic simulation; microwave assisted switching; noise-like resonant excitation; noise-like weak signal; optimum relative phase; physical properties; resonant switching; spin transfer torque; switching probability; universal memory; Educational institutions; Magnetic tunneling; Magnetization; Magnetoelectronics; Micromagnetics; Resonant frequency; Switches; Chaotic sequences; MRAM; resonant switching; spin-transfer torque;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2012.2194718