DocumentCode :
1496827
Title :
Compact damping models for laterally moving microstructures with gas-rarefaction effects
Author :
Veijola, Timo ; Turowski, Marek
Author_Institution :
Dept. of Electr. & Commun. Eng., Helsinki Univ. of Technol., Espoo, Finland
Volume :
10
Issue :
2
fYear :
2001
fDate :
6/1/2001 12:00:00 AM
Firstpage :
263
Lastpage :
273
Abstract :
Compact models for the viscous damping coefficient in narrow air gaps between laterally moving structures are reported. In the first part of the paper, a simple frequency-independent first-order slip-flow approximation for the damping coefficient is derived and compared with a more accurate expression obtained from the linearized Boltzmann equation. The simple approximation is slightly modified and fitted to match the accurate model. The resulting simple approximation has a maximum relative error of less than ±6% at arbitrary Knudsen numbers in viscous, transitional and free molecular regions. In the second part of the paper, dynamic models for the damping force are derived, considering again gas rarefaction, by applying various boundary conditions. The damping admittance of the first-order slip-flow model is implemented also as an electrical equivalent admittance, constructed of RC sections, to allow both frequency and time domain simulations with a circuit simulator. The dependence of the damping admittance on pressure and gap displacement is demonstrated with model simulations. The accuracy and validity range of the model are verified with comparative numerical simulations of the Navier-Stokes equation. Finally, the damping coefficient in a lateral resonator is calculated using the compact model and compared with measured data with good agreement
Keywords :
Boltzmann equation; Couette flow; Knudsen flow; Navier-Stokes equations; Q-factor; damping; frequency-domain analysis; microfluidics; microsensors; slip flow; time-domain analysis; Navier-Stokes equation; arbitrary Knudsen numbers; boundary conditions; circuit simulator; compact damping models; comparative numerical simulations; electrical equivalent admittance; first-order slip-flow model; frequency domain simulations; frequency-independent first-order slip-flow approximation; gap displacement; gas-rarefaction effects; lateral resonator; laterally moving microstructures; linearized Boltzmann equation; relative error; time domain simulations; Admittance; Air gaps; Boltzmann equation; Boundary conditions; Circuit simulation; Damping; Frequency; Microstructure; Navier-Stokes equations; Numerical simulation;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.925777
Filename :
925777
Link To Document :
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