• DocumentCode
    1496881
  • Title

    Strength predictions for interlocking microridges fabricated with different geometries

  • Author

    Chu, Lung-hsi ; Chen, Quanfang ; Carman, Greg P.

  • Author_Institution
    Mech. & Aerosp. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    10
  • Issue
    2
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    310
  • Lastpage
    315
  • Abstract
    This paper analytically evaluates the strength of microcomponents fabricated using both wet and dry etching techniques. A finite element model (nanometer meshed) coupled with a macroscopically accepted energy criterion is used to predict the strength of four different microridge structures (geometries). Agreement between analytical predictions and experimental data on single crystal silicon is excellent and validates the use of macroscopic models to predict the strength of micromachined components fabricated with a wide range of processes. The model is used to evaluate design parameters such as the influence of height and ridge material on strength properties. The analytical portion of the study suggests that optimum ridge height exists to maximize the strength and by choosing tougher materials, the strength of the ridges may be improved by an order of magnitude. However, the significant strength improvement is not validated experimentally. The simulation results confirm that the geometries rather than etching flaws are critical issues when dealing with strength of micromachined components. Furthermore, standard macroscopic methods can be used to predict the strength of MEMS components at the micron size level
  • Keywords
    etching; finite element analysis; mechanical strength; micromachining; micromechanical devices; MEMS component; Si; computer simulation; crystal silicon; design parameters; dry etching; energy criterion; fabrication; finite element model; interlocking microridges; mechanical strength; micromachining; wet etching; Crystalline materials; Fatigue; Finite element methods; Geometry; Microscopy; Predictive models; Silicon; Solid modeling; Stress; Testing;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.925794
  • Filename
    925794