Title :
Electroluminescence Transition From Visible- to Ultraviolet-Dominant Mode in
Author :
Hai Zhou ; Yongdan Zhu ; Hao Wang ; Xu Chen ; Guojia Fang
Author_Institution :
Fac. of Phys. & Electron. Technol., Hubei Univ., Wuhan, China
Abstract :
We report an n-Mn0.04Zn0.96O(MZO) /i-ZnGa2O4/ n-GaN structure both as a light-emitting diode and as an ultraviolet (UV) photodetector at forward and reverse biases, respectively. The n-MZO films were prepared on n-GaN coated sapphire substrates, followed by postdeposition thermal annealing treatment at 700 °C, and an i-ZnGa2O4 interface layer was formed at the MZO/GaN interface after the annealing treatment. We found that the electroluminescence characteristics showed a transition from visible- to UV-dominant mode when the deposition temperature of the MZO film is from 100 °C to 300 °C. For the UV detection performance, the devices based on the low-temperature deposition (100 °C) of the MZO film showed the lowest dark current and the biggest ratio of photocurrent to dark current with a selectivity detectivity for 365 nm around light.
Keywords :
III-V semiconductors; annealing; dark conductivity; electroluminescence; gallium compounds; light emitting diodes; manganese compounds; photodetectors; semiconductor thin films; ultraviolet detectors; wide band gap semiconductors; zinc compounds; MnZnO-ZnGa2O4-GaN; dark current; electroluminescence transition; forward bias; light emitting diode; photocurrent; postdeposition thermal annealing treatment; reverse bias; sapphire substrates; selectivity detectivity; temperature 100 degC to 300 degC; temperature 700 degC; ultraviolet detection performance; ultraviolet photodetector; visible-to-UV dominant mode; wavelength 365 nm; Annealing; Dark current; Gallium nitride; Heterojunctions; Light emitting diodes; Surface morphology; Zinc oxide; Electroluminescence (EL); photodetector (PDs); ultraviolet (UV)-dominant mode; visible-dominant mode;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2012.2236295