Simulation and implementation of lightwave component characterization using a bilateral electro-optic network

Author

Elamaran, Balasundaram ; Pollard, Roger D. ; Iezekiel, Stavros

Author_Institution

Dept. of Electron. & Electr. Eng., Leeds Univ., UK

Volume

45

Issue

8

fYear

1997

fDate

8/1/1997 12:00:00 AM

Firstpage

1493

Lastpage

1496

Abstract

The simulation and implementation of a bilateral electro-optic network has been demonstrated. The advantage of the proposed network is that it can be used as a black box to convert a microwave network analyzer into a two-port lightwave network analyzer. Simulations have been carried out to determine the sensitivity of the bilateral network to optical reflections. Measurement results on one-port optical structures are more accurate than those obtained with commercial lightwave analyzers and indicate the viability of this approach for full two-port lightwave measurements

Keywords

S-parameters; calibration; light reflection; measurement by laser beam; microwave measurement; network analysers; optical variables measurement; sensitivity analysis; test equipment; bilateral electro-optic network; deembedding procedure; lightwave component characterization; microwave network analyzer conversion; one-port optical structures; optical reflections; sensitivity; two-port lightwave measurements; two-port lightwave network analyzer; Calibration; High speed optical techniques; Microwave measurements; Optical devices; Optical fiber networks; Optical modulation; Optical reflection; Optical sensors; Photodiodes; Testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.618461

Filename

618461