• DocumentCode
    1497305
  • Title

    AC losses in the SMES conductor and coil structure

  • Author

    Gurol, H. ; Motowidlo, L. ; Luongo, C.

  • Author_Institution
    Gen. Dynamics Space Syst. Div., San Diego, CA, USA
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    1582
  • Lastpage
    1585
  • Abstract
    The authors present a methodology for calculating AC losses in the SMES/ETM (Superconducting Magnetic Energy Storage/Engineering Test Model) conductor and coil structure. Coupling and eddy current losses are discussed for a 100-s discharge of a 143-m-diameter ETM with a total stored energy of 21 MWh. The chosen pitch length, filament size, and winding configuration are shown to result in coupling losses that are small during this 400-MW. The total coupling losses are about 0.0048 J/cm3. The structural current losses result in energy deposition of about 0.05 J/cm3 during the same discharge. The energy is being deposited in the structure (away from the conductor) and over a very long time as far as stability is concerned (100/s). In addition, the highest power deposition occurs toward the end of the discharge, when the conductor current is lowest. The AC losses during slow utility discharge, calculated using the proposed methodology, represent part of the steady-state heat load to be removed by the refrigeration system
  • Keywords
    coils; eddy currents; superconducting magnet energy storage; AC losses; Engineering Test Model; SMES conductor; Superconducting Magnetic Energy Storage; coil structure; coupling losses; eddy current losses; energy deposition; filament size; pitch length; refrigeration system; steady-state heat load; stored energy; structural current losses; utility discharge; winding configuration; Conductors; Eddy currents; Power engineering and energy; Refrigeration; Samarium; Stability; Steady-state; Superconducting coils; Superconducting magnetic energy storage; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92600
  • Filename
    92600