Title :
Mode control in vertical-cavity surface-emitting lasers by post-processing using focused ion-beam etching
Author :
Dowd, P. ; Raddatz, L. ; Sumaila, Y. ; Asghari, M. ; White, I.H. ; Penty, R.V. ; Heard, P.J. ; Allen, G.C. ; Schneider, R.P. ; Tan, M.R.T. ; Wang, S.Y.
Author_Institution :
Dept. of Electr. & Electron. Eng., Bristol Univ., UK
Abstract :
Single-mode emission is achieved in previously multimode gain-guided vertical-cavity surface-emitting lasers (VCSEL´s) by localized modification of the mirror reflectivity using focused ion-beam etching. Reflectivity engineering is also demonstrated to suppress transverse mode emission in an oxide-confined device, reducing the spectral width from 1.2 nm to less than 0.5 nm.
Keywords :
focused ion beam technology; laser cavity resonators; laser mirrors; laser modes; optical variables control; quantum well lasers; sputter etching; surface emitting lasers; AlAs-AlGaAs; GaAs; GaAs quantum well top-emitting devices; focused ion-beam etching; localized modification; mirror reflectivity; mode control; multimode gain-guided vertical-cavity surface-emitting lasers; oxide-confined device; post-processing; reflectivity engineering; single-mode emission; spectral width; transverse mode emission suppression; vertical-cavity surface-emitting lasers; Educational institutions; Gallium arsenide; Laser modes; Mirrors; Optical control; Polarization; Reflectivity; Sputter etching; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE
