DocumentCode :
1497959
Title :
Understanding Noise Mechanism in Small Grain Size Perpendicular Thin Film Media
Author :
Wang, Yiming ; Zhu, Jian-Gang
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
46
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
2391
Lastpage :
2393
Abstract :
One of the myths of today´s perpendicular thin film media is that there is no noticeable gain in medium signal-to-noise ratio (SNR) as grain size reduces below 8 nm. A recent experimental study shows that intergranular exchange coupling exhibits an exponential dependence of the oxide grain boundary thickness for the thickness below 1 nanometer. In this paper, we present a systematic micromagnetic modeling analysis regarding the effect of spatially random intergranular exchange coupling due to the variation in grain boundary thickness. As oxide boundary becomes sufficiently thin in small grain size media, a distribution in the grain boundary thickness is found to cost significant SNR loss according to simulation results.
Keywords :
exchange interactions (electron); grain size; micromagnetics; noise; perpendicular magnetic recording; grain size; intergranular exchange coupling; noise mechanism; oxide grain boundary; perpendicular thin film media; systematic micromagnetic modeling; Costs; Couplings; Grain boundaries; Grain size; Magnetic heads; Micromagnetics; Perpendicular magnetic recording; Signal to noise ratio; Transistors; USA Councils; Intergranular exchange coupling; perpendicular magnetic recording; signal-to-noise ratio (SNR);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2040070
Filename :
5467390
Link To Document :
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