• DocumentCode
    1497985
  • Title

    Interface Magnetism of \\hbox {Au/Co/Cr}_{2}\\hbox {O}_{3}(0001) Epitaxial Film With Perpendicular Magnetic Anisotropy and Perpendicular Exchange Bias

  • Author

    Shiratsuchi, Yu ; Kawahara, Shin-ichi ; Noutomi, Hayato ; Nakatani, Ryoichi

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Osaka Univ., Suita, Japan
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1618
  • Lastpage
    1621
  • Abstract
    We have investigated interface magnetism of Au-capped ultrathin Co film grown on antiferromagnetic Cr2O3(0001) thin film. In particular, perpendicular magnetic anisotropy and perpendicular exchange bias are investigated. To strengthen the analysis, structural investigations are also conducted. Ultrathin Co film shows both perpendicular magnetic anisotropy and perpendicular exchange bias. Perpendicular magnetic anisotropy is mainly caused by Au capping layer. However, Co/Cr2O3 interface also affects the perpendicular magnetic anisotropy through the collinear exchange coupling of Co spin and Cr spin. The collinear exchange coupling gives rise to the perpendicular exchange bias. This is explained by aligned Cr spin direction owing to epitaxial growth and small lattice misfit.
  • Keywords
    antiferromagnetic materials; cobalt; gold; interface magnetism; magnetic epitaxial layers; perpendicular magnetic anisotropy; Au-Co-Cr2O3; Cr2O3; antiferromagnetic thin film; capping layer; collinear exchange coupling; epitaxial film; epitaxial growth; interface magnetism; interface phenomena; magnetic films; perpendicular exchange bias; perpendicular magnetic anisotropy; Antiferromagnetic materials; Chromium; Couplings; Epitaxial growth; Gold; Magnetic analysis; Magnetic anisotropy; Magnetic films; Perpendicular magnetic anisotropy; Transistors; Antiferromagnetic material; epitaxial growth; interface phenomena; magnetic films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2044372
  • Filename
    5467393