Title : 
The Effects of CrV Underlayer on the Structure and Magnetic Properties of FePt Thin Film
         
        
            Author : 
Chun, DongWon ; Kim, Sungman ; Kim, Gyeungho ; Jeung, WonYoung
         
        
            Author_Institution : 
Div. of Mater. Res., Korea Inst. of Sci. & Technol., Seoul, South Korea
         
        
        
        
        
            fDate : 
6/1/2010 12:00:00 AM
         
        
        
        
            Abstract : 
An attempt is made in this study to employ vanadium containing chromium (CrV) alloy underlayer to control the microstructure and ultimately to facilitate the in-situ ordering of Fe-Pt thin film. CrV alloys with V contents ranging from 0 to 15 at% were investigated to evaluate their effects on the magnetic properties and structural modification of FePt thin film. Addition of V in Cr underlayer results in the formation of FePt L10 phase with (001) preferred orientation. Analysis of XRD and HR-TEM results reveals that the lattice expansion of Cr underlayer induced by V addition increases the lattice misfit strain between CrV underlayer and FePt magnetic layer. Consequently well aligned FePt (001) grains and in-situ ordering of FePt L10 thin film can be obtained. Magnetic property measurements show that FePt/Pt/5.8 at.%V-Cr multilayer has the maximum out-of-plane coercivity (4000 Oe) and squareness (0.95). Due to in-situ ordering, good perpendicular magnetic properties with higher coercivity and squareness were achieved from FePt/Pt/Cr94.2V5.8 multi-layers at the processing temperature of 350°C without further annealing treatment.
         
        
            Keywords : 
X-ray diffraction; chromium alloys; coercive force; iron alloys; magnetic hysteresis; magnetic multilayers; magnetic thin films; metallic thin films; platinum; platinum alloys; texture; transmission electron microscopy; vanadium alloys; (001) preferred orientation; FePt-Pt-Cr94.2V5.8; HR-TEM; L10 phase; XRD; annealing; in-situ ordering; magnetic properties; microstructure; multilayer; out-of-plane coercivity; squareness; structural modification; temperature 350 degC; thin film; underlayer; Chromium alloys; Coercive force; Lattices; Magnetic analysis; Magnetic field induced strain; Magnetic films; Magnetic properties; Microstructure; Transistors; X-ray scattering; in-situ ordering; CrV underlayer; FePt film; perpendicular magnetic recording media;
         
        
        
            Journal_Title : 
Magnetics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TMAG.2009.2039553