DocumentCode :
1498560
Title :
Analysis of Failure Rate by Column Distribution in Magnetically Aligned Anisotropic Conductive Adhesive
Author :
Moon, Sungwook ; Chappell, William J.
Author_Institution :
Indiana Microelectron., LLC, West Lafayette, IN, USA
Volume :
1
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
784
Lastpage :
791
Abstract :
Characteristics of z-axis interconnects using magnetically aligned anisotropic conductive adhesives (ACAs) are analyzed for their applicability for small pad sizes. In order to evaluate the performance of ACAs, a statistical estimation of the failure rate of interconnects was carried out using top-view images of assembled samples. Through a column mapping process, the failure rate is calculated as a function of pad size. The calculated and measured results indicate that the location of the formed columns is the predominant effect determining interconnect failure. The developed failure estimation approach is effective in demonstrating the effects of scaling to smaller particles in ACAs.
Keywords :
anisotropic media; conductive adhesives; estimation theory; failure analysis; integrated circuit interconnections; statistical distributions; IC-to-IC interconnection; anisotropic media; column distribution; column mapping process; failure estimation approach; failure rate analysis; magnetically aligned anisotropic conductive adhesive; small pad size; statistical distribution; statistical estimation; Magnetic resonance imaging; Packaging; Perpendicular magnetic anisotropy; Resistance; Silicon; Substrates; Anisotropic media; conductive particles; failure mechanism; interconnects; packaging; statistical distribution;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2011.2111374
Filename :
5752833
Link To Document :
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