• DocumentCode
    1498560
  • Title

    Analysis of Failure Rate by Column Distribution in Magnetically Aligned Anisotropic Conductive Adhesive

  • Author

    Moon, Sungwook ; Chappell, William J.

  • Author_Institution
    Indiana Microelectron., LLC, West Lafayette, IN, USA
  • Volume
    1
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    784
  • Lastpage
    791
  • Abstract
    Characteristics of z-axis interconnects using magnetically aligned anisotropic conductive adhesives (ACAs) are analyzed for their applicability for small pad sizes. In order to evaluate the performance of ACAs, a statistical estimation of the failure rate of interconnects was carried out using top-view images of assembled samples. Through a column mapping process, the failure rate is calculated as a function of pad size. The calculated and measured results indicate that the location of the formed columns is the predominant effect determining interconnect failure. The developed failure estimation approach is effective in demonstrating the effects of scaling to smaller particles in ACAs.
  • Keywords
    anisotropic media; conductive adhesives; estimation theory; failure analysis; integrated circuit interconnections; statistical distributions; IC-to-IC interconnection; anisotropic media; column distribution; column mapping process; failure estimation approach; failure rate analysis; magnetically aligned anisotropic conductive adhesive; small pad size; statistical distribution; statistical estimation; Magnetic resonance imaging; Packaging; Perpendicular magnetic anisotropy; Resistance; Silicon; Substrates; Anisotropic media; conductive particles; failure mechanism; interconnects; packaging; statistical distribution;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2111374
  • Filename
    5752833