DocumentCode :
1498672
Title :
Measurement of pull-off force for planar contact at the microscale
Author :
Rabenorosoa, Kanty ; Clevy, Cedric ; Lutz, Philippe ; Gauthier, Michael ; Rougeot, Patrick
Author_Institution :
FEMTO-ST Inst., CNRS, Besancon, France
Volume :
4
Issue :
3
fYear :
2009
Firstpage :
148
Lastpage :
154
Abstract :
At the microscale, surface forces influence the behaviour of micro-objects more than volumic forces. During micro-assembly processes, contacts occur between a microgripper and a micro-object or between a substrate and a micro-object. The pull-off force, which represents the force required to break a contact, is one of the predominant problems in micro-assembly. Current force measurements are mostly focused on sphere-plane geometries, and models are based on nanoscale theories. The aim of this letter is to propose an evaluation of the pull-off force for a planar contact, which is the most frequent kind of contact in micro-assembly. Experimental force measurements based on a capacitive microforce sensor and micro/nano robotic systems are carried out. The proposed device enables the study of pull-off forces according to the preload force and the contact angle. Finally, experimental results are discussed and compared with a model.
Keywords :
capacitive sensors; contact angle; elemental semiconductors; force measurement; force sensors; microassembling; micromechanical devices; microrobots; silicon; Si; capacitive microforce sensor; contact angle; current force measurements; microassembly processes; microgripper; microobjects; microrobotic systems; nanorobotic systems; planar silicon-silicon contact; preload force; pull-off force; surface forces;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2009.0034
Filename :
5285997
Link To Document :
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