• DocumentCode
    1498781
  • Title

    A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise

  • Author

    Son, Younghwan ; Kang, Taewook ; Park, Sunyoung ; Shin, Hyungcheol

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    10
  • Issue
    6
  • fYear
    2011
  • Firstpage
    1352
  • Lastpage
    1356
  • Abstract
    A simple model for electron capture and emission process in oxide traps is introduced for analysis of random telegraph signal noise. Multiphonon emission capture theory is used for a “more fundamental” thermally activated capture cross-sectional model. Basically, Shockley-Read-Hall statistics is considered for time constant modeling. Particularly, the thermally activation model with the quantum effect is applied to emission time constant modeling. It is shown that the capture and emission process are controlled by characteristics of traps. Especially, the physical meaning of the lattice relaxation energy which is the most important model parameter and the trap characteristic is clarified.
  • Keywords
    electron emission; phonon-phonon interactions; random noise; Shockley-Read-Hall statistics; capture time constant; electron emission process; emission time constant; lattice relaxation energy; multiphonon emission capture theory; oxide traps; quantum effect; random telegraph signal noise; thermally activated capture cross-sectional model; Biological system modeling; Electron traps; Logic gates; Mathematical model; Noise measurement; Voltage measurement; Capture; capture cross section; emission; noise; oxide trap; random telegraph signal (RTS); time constant modeling;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2011.2142401
  • Filename
    5752864