DocumentCode
1498781
Title
A Simple Model for Capture and Emission Time Constants of Random Telegraph Signal Noise
Author
Son, Younghwan ; Kang, Taewook ; Park, Sunyoung ; Shin, Hyungcheol
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Volume
10
Issue
6
fYear
2011
Firstpage
1352
Lastpage
1356
Abstract
A simple model for electron capture and emission process in oxide traps is introduced for analysis of random telegraph signal noise. Multiphonon emission capture theory is used for a “more fundamental” thermally activated capture cross-sectional model. Basically, Shockley-Read-Hall statistics is considered for time constant modeling. Particularly, the thermally activation model with the quantum effect is applied to emission time constant modeling. It is shown that the capture and emission process are controlled by characteristics of traps. Especially, the physical meaning of the lattice relaxation energy which is the most important model parameter and the trap characteristic is clarified.
Keywords
electron emission; phonon-phonon interactions; random noise; Shockley-Read-Hall statistics; capture time constant; electron emission process; emission time constant; lattice relaxation energy; multiphonon emission capture theory; oxide traps; quantum effect; random telegraph signal noise; thermally activated capture cross-sectional model; Biological system modeling; Electron traps; Logic gates; Mathematical model; Noise measurement; Voltage measurement; Capture; capture cross section; emission; noise; oxide trap; random telegraph signal (RTS); time constant modeling;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2011.2142401
Filename
5752864
Link To Document