Title :
Statistics in Semiconductor Test: Going beyond Yield
Author :
Daasch, W. Robert ; Shirley, C. Glenn ; Nahar, Amit
Author_Institution :
Portland State Univ., Portland, OR, USA
Abstract :
The quantity and complexity of data generated at each test manufacturing step can be daunting. This article, which emerged from a tutorial presented at ITC 2008, explains the application of statistics to help process that data and provides examples of how test has shifted from descriptive to predictive methods.
Keywords :
integrated circuit testing; monolithic integrated circuits; statistics; semiconductor test; statistics; test manufacturing; Agricultural engineering; Automatic control; Automatic testing; Decision making; Manufacturing processes; Optimization methods; Semiconductor device manufacture; Semiconductor device testing; Statistical analysis; Statistical distributions; burn-in; data mining; design and test; multisite testing; outlier identification; outlier screening; statistical modeling; statistical test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.123
