DocumentCode
1498892
Title
Front-End ASIC for a Liquid Argon TPC
Author
De Geronimo, Gianluigi ; D´Andragora, Alessio ; Li, Shaorui ; Nambiar, Neena ; Rescia, Sergio ; Vernon, Emerson ; Chen, Hucheng ; Lanni, Francesco ; Makowiecki, Don ; Radeka, Veljko ; Thorn, Craig ; Yu, Bo
Author_Institution
Brookhaven Nat. Lab., Upton, NY, USA
Volume
58
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
1376
Lastpage
1385
Abstract
We present a front-end application-specific integrated circuit (ASIC) for a wire based time-projection-chamber (TPC) operating in liquid Argon (LAr). The LAr TPC will be used for long baseline neutrino oscillation experiments. The ASIC must provide a low-noise readout of the signals induced on the TPC wires, digitization of those signals at 2 MSamples/s, compression, buffering and multiplexing. A resolution of better than 1000 rms electrons at 200 pF input capacitance for an input range of 300 fC is required, along with low power and operation in LAr (at 87 K). We include the characterization of a commercial technology for operation in the cryogenic environment and the first experimental results on the analog front end. The results demonstrate that complementary metal-oxide semiconductor transistors have lower noise and much improved dc characteristics at LAr temperature. Finally, we introduce the concept of “1/f equivalent” to model the low-frequency component of the noise spectral density, for use in the input metal-oxide semiconductor field-effect transistor optimization.
Keywords
MOSFET; application specific integrated circuits; neutrino oscillations; readout electronics; time projection chambers; TPC wires; application-specific integrated circuit; front-end ASIC; liquid argon; low-frequency component; low-noise readout; metal-oxide semiconductor field-effect transistor optimization; neutrino oscillation experiment; noise spectral density; time-projection-chamber; Application specific integrated circuits; Capacitance; Current measurement; MOSFET circuits; Noise; Wire; Analog-to-digital converter (ADC); application-specific integrated circuit (ASIC); cryogenic; noise;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2011.2127487
Filename
5752881
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