• DocumentCode
    1498892
  • Title

    Front-End ASIC for a Liquid Argon TPC

  • Author

    De Geronimo, Gianluigi ; D´Andragora, Alessio ; Li, Shaorui ; Nambiar, Neena ; Rescia, Sergio ; Vernon, Emerson ; Chen, Hucheng ; Lanni, Francesco ; Makowiecki, Don ; Radeka, Veljko ; Thorn, Craig ; Yu, Bo

  • Author_Institution
    Brookhaven Nat. Lab., Upton, NY, USA
  • Volume
    58
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1376
  • Lastpage
    1385
  • Abstract
    We present a front-end application-specific integrated circuit (ASIC) for a wire based time-projection-chamber (TPC) operating in liquid Argon (LAr). The LAr TPC will be used for long baseline neutrino oscillation experiments. The ASIC must provide a low-noise readout of the signals induced on the TPC wires, digitization of those signals at 2 MSamples/s, compression, buffering and multiplexing. A resolution of better than 1000 rms electrons at 200 pF input capacitance for an input range of 300 fC is required, along with low power and operation in LAr (at 87 K). We include the characterization of a commercial technology for operation in the cryogenic environment and the first experimental results on the analog front end. The results demonstrate that complementary metal-oxide semiconductor transistors have lower noise and much improved dc characteristics at LAr temperature. Finally, we introduce the concept of “1/f equivalent” to model the low-frequency component of the noise spectral density, for use in the input metal-oxide semiconductor field-effect transistor optimization.
  • Keywords
    MOSFET; application specific integrated circuits; neutrino oscillations; readout electronics; time projection chambers; TPC wires; application-specific integrated circuit; front-end ASIC; liquid argon; low-frequency component; low-noise readout; metal-oxide semiconductor field-effect transistor optimization; neutrino oscillation experiment; noise spectral density; time-projection-chamber; Application specific integrated circuits; Capacitance; Current measurement; MOSFET circuits; Noise; Wire; Analog-to-digital converter (ADC); application-specific integrated circuit (ASIC); cryogenic; noise;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2127487
  • Filename
    5752881