• DocumentCode
    1498939
  • Title

    Influence of Intermediate Layer on Magnetic Properties of L1_{0} Ordered FePt Perpendicular Recording Media

  • Author

    Li, Xu ; Li, Zhenghua ; Liu, Xi ; Li, Yanbo ; Bai, Jianmin ; Wei, Fulin ; Wei, Dan

  • Author_Institution
    Key Lab. for Magn. & Magn. Mater. of the Minist. of Educ., Lanzhou Univ., Lanzhou, China
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    2024
  • Lastpage
    2027
  • Abstract
    The L10 ordered FePt thin films have been prepared by magnetron sputtering system on Cr85W15 underlayer at 500°C of substrate temperature. A 3 nm Pt or W thin interlayer was employed to modulate the magnetic properties of FePt films. The crystallographic relationship between the FePt thin film and the CrW underlayer was studied, and the dependence of FePt films structure and magnetic properties on the Pt or W interlayer was investigated. The M-H loop of the FePt films with Pt or W interlayer was analyzed by using a three-dimensional (3-D) micromagnetic model, with careful discussions of the tetragonal symmetry and the magneto-elastic anisotropy due to the stress in the film plane. The stress state in the films and its effect on magnetic properties were discussed.
  • Keywords
    crystal symmetry; ferromagnetic materials; internal stresses; iron alloys; magnetic anisotropy; magnetic thin films; magnetoelastic effects; micromagnetics; perpendicular magnetic recording; platinum alloys; sputter deposition; stress effects; Cr85W15; FePt; L10 ordered perpendicular recording media; L10 ordered thin films; intermediate layer; magnetic properties; magnetoelastic anisotropy; magnetron sputtering; stress state; temperature 500 degC; tetragonal symmetry; thin interlayer; three-dimensional micromagnetic model; Chromium; Magnetic anisotropy; Magnetic films; Magnetic modulators; Magnetic properties; Perpendicular magnetic anisotropy; Sputtering; Stress; Substrates; Temperature; CrW underlayer; FePt film; interlayer; magnetostriction; micromagnetic method;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2041052
  • Filename
    5467525