DocumentCode :
1498977
Title :
Carrier Frequency Offset Estimation for OFDM Systems Over Mobile Radio Channels
Author :
Al-Dweik, A. ; Hazmi, A. ; Younis, S. ; Sharif, B. ; Tsimenidis, C.
Author_Institution :
Dept. of Commun. Eng., Khalifa Univ. of Sci., Technol. & Res., Sharjah, United Arab Emirates
Volume :
59
Issue :
2
fYear :
2010
Firstpage :
974
Lastpage :
979
Abstract :
In this paper, a new technique is proposed for blind estimation of carrier frequency offset (CFO) in wireless orthogonal frequency-division multiplexing (OFDM) systems with constant-modulus constellations. The proposed scheme is based on the assumption that the channel slowly changes in the time domain with respect to the OFDM symbol duration. As a consequence, the channel effect on a given subcarrier in two consecutive OFDM symbols is approximately the same. Based on this assumption, a cost function is derived such that the power difference between all subcarriers in two consecutive OFDM symbols is minimized. Using Monte Carlo simulation, we demonstrate that the proposed scheme has superior performance in both static and time-varying frequency-selective fading channels. The proposed system can rapidly and accurately estimate the CFO using only three trial values, given that the CFO is less than half of the subcarriers´ frequency spacing.
Keywords :
Monte Carlo methods; OFDM modulation; blind source separation; fading channels; frequency estimation; mobile radio; time-domain analysis; time-varying channels; Monte Carlo simulation; OFDM symbol duration; OFDM systems; blind estimation; carrier frequency offset estimation; channel effect; constant-modulus constellations; mobile radio channels; subcarrier frequency spacing; time domain; time-varying frequency-selective fading channels; wireless orthogonal frequency-division multiplexing systems; Blind estimation; Doppler shift; frequency domain; frequency offset; frequency selective; orthogonal frequency-division multiplexing (OFDM); time domain;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2009.2034169
Filename :
5286209
Link To Document :
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