• DocumentCode
    1499055
  • Title

    Fast Iterative Solution Algorithms in the Frequency-Domain Layered Finite Element Method for Analyzing Integrated Circuits

  • Author

    Sheng, Feng ; Gan, Houle ; Jiao, Dan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ. West Lafayette, West Lafayette, IN, USA
  • Volume
    33
  • Issue
    2
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    524
  • Lastpage
    533
  • Abstract
    Fast algorithms are developed in this work for solving the system matrix resulting from a frequency-domain layered finite element based analysis of integrated circuits. The frequency-domain layered finite element method represents a 3-D layered system by a 2-D layered system, and further by a single-layered one. The reduced system matrix is generally denser than the original sparse matrix. In this paper, we show that 1) the dense matrix-vector multiplication can be performed in linear complexity; in addition, the reduction cost can be bypassed, 2) an effective preconditioner can be developed to converge the iterative solution of the reduced system matrix in a small number of iterations, and 3) the preconditioner can be solved in linear complexity. As a result, the reduced system matrix can be solved efficiently. The algorithms are rigorous without making any approximation. They apply to any arbitrarily-shaped multilayer structure. Numerical results demonstrated the accuracy, effectiveness, and efficiency of the proposed algorithms in analyzing on-chip circuits.
  • Keywords
    finite element analysis; frequency-domain analysis; integrated circuit design; iterative methods; network analysis; sparse matrices; frequency-domain layered finite element method; integrated circuits analysis; iterative solution algorithms; on-chip circuits; sparse matrix; system matrix; Electromagnetic modeling; finite element method; frequency domain; iterative solver; on chip; preconditioner;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2009.2029561
  • Filename
    5286220