DocumentCode
1499108
Title
Domain Patterns and Magnetization Reversal Behaviors in Oxide/Co/Pt Films
Author
Lee, Jae-Chul ; Lee, Kang-Soo ; Cho, Cheong-Gu ; Moon, Kyoung-Woong ; Shin, Kyung-Ho ; Choe, Sug-Bong
Volume
46
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
2009
Lastpage
2011
Abstract
The domain patterns and magnetization reversal behaviors in oxide/Co/Pt films are examined with varying the thickness of Co layer from 0.7 nm to 2.0 nm. The films are grown on Al2O3, MgO and SiO2 layers. All the films exhibit strong perpendicular magnetic anisotropy, but the anisotropy decreases with increasing Co layer thickness for all the oxide layers. The decrement rate is different for different oxide layers. The domain patterns show the transition between the wall-motion and dendrite-growth dominant behaviors, and the critical thickness is estimated to be about 1.0 nm irrespective of the oxide layers. We summarize the magnetic properties of oxide/Co/Pt films with respect to the Co-thickness and various oxide layers.
Keywords
alumina; cobalt; dendrites; magnesium compounds; magnetic domain walls; magnetic multilayers; magnetic thin films; magnetisation reversal; perpendicular magnetic anisotropy; platinum; silicon compounds; Al2O3-Co-Pt; Co layer thickness; MgO-Co-Pt; SiO2-Co-Pt; critical thickness; decrement rate; dendrite-growth dominant behaviors; domain patterns; magnetic properties; magnetization reversal behaviors; oxide layers; oxide-Co-Pt films; perpendicular magnetic anisotropy; size 0.37 nm to 2.0 nm; wall-motion; Anisotropic magnetoresistance; Annealing; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetic materials; Magnetization reversal; Perpendicular magnetic anisotropy; Domain pattern; oxide/Co interface; perpendicular magnetic anisotropy;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2040813
Filename
5467549
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