Reverse Overwrite Process in Shingled Recording Process at Ultrahigh Track Density

Author

Li, Shaoping ; Mendez, Hector ; Terrill, Dave ; Liu, Feng ; Jin, Zhen ; Guo, Yimin ; Zhong, Lieping ; Torabi, Adam ; Mao, Sining

Author_Institution

Western Digital, Inc., Fremont, CA, USA

Volume

46

Issue

6

fYear

2010

fDate

6/1/2010 12:00:00 AM

Firstpage

2497

Lastpage

2500

Abstract

A systematic experimental study of reverse overwrite (ReOVW) process in the shingled recording scheme has been conducted in conjunction with characterization of corresponding recording performances from recording heads with different geometries. It was found that not only is there no ReOVW reduction as the track density increases, but also ReOVW is, in fact, slightly increased from 300 ktpi to 600 kpi or beyond by using the same writing conditions. These data suggest that conventional magnetic recording technology might be able to extend all the way beyond an areal density of one Tbit/in² by using the shingled recording scheme.

Keywords

magnetic heads; perpendicular magnetic recording; areal density; magnetic recording; recording heads; reverse overwrite process; shingled recording process; ultrahigh track density; Digital magnetic recording; Digital recording; Geometry; Magnetic heads; Magnetic materials; Magnetic recording; Perpendicular magnetic recording; Saturation magnetization; Tunneling magnetoresistance; Writing; Perpendicular recording (PMR); reverse overwrite; shingled recording; track edge noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2010.2042933

Filename

5467579