DocumentCode :
1499319
Title :
Reverse Overwrite Process in Shingled Recording Process at Ultrahigh Track Density
Author :
Li, Shaoping ; Mendez, Hector ; Terrill, Dave ; Liu, Feng ; Jin, Zhen ; Guo, Yimin ; Zhong, Lieping ; Torabi, Adam ; Mao, Sining
Author_Institution :
Western Digital, Inc., Fremont, CA, USA
Volume :
46
Issue :
6
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
2497
Lastpage :
2500
Abstract :
A systematic experimental study of reverse overwrite (ReOVW) process in the shingled recording scheme has been conducted in conjunction with characterization of corresponding recording performances from recording heads with different geometries. It was found that not only is there no ReOVW reduction as the track density increases, but also ReOVW is, in fact, slightly increased from 300 ktpi to 600 kpi or beyond by using the same writing conditions. These data suggest that conventional magnetic recording technology might be able to extend all the way beyond an areal density of one Tbit/in2 by using the shingled recording scheme.
Keywords :
magnetic heads; perpendicular magnetic recording; areal density; magnetic recording; recording heads; reverse overwrite process; shingled recording process; ultrahigh track density; Digital magnetic recording; Digital recording; Geometry; Magnetic heads; Magnetic materials; Magnetic recording; Perpendicular magnetic recording; Saturation magnetization; Tunneling magnetoresistance; Writing; Perpendicular recording (PMR); reverse overwrite; shingled recording; track edge noise;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2010.2042933
Filename :
5467579
Link To Document :
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