DocumentCode
1499406
Title
Analysis of Digital Circuit Dynamic Behavior With Timed Ternary Decision Diagrams for Better-Than-Worst-Case Design
Author
Wan, Lu ; Chen, Deming
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume
31
Issue
5
fYear
2012
fDate
5/1/2012 12:00:00 AM
Firstpage
662
Lastpage
675
Abstract
Modern logic optimization tools tend to optimize circuits in a balanced way so that all primary outputs (POs) have the similar delay close to the cycle time. However, in reality, certain POs will be exercised more frequently than the rest. Among the critical POs, some may be stabilized very quickly by input vectors, even if their topological delays from primary inputs are very long. Knowing the dynamic behavior of a circuit can help optimize the most commonly activated paths and help engineers understand how resilient a PO is against dynamic environmental variations such as voltage fluctuations. In this paper, we describe a tool to analyze the dynamic behavior of a digital circuit utilizing probabilistic information. The techniques exploit the use of timed ternary decision diagrams (tTDD) to encode stabilization conditions for POs. To compute probabilities based on a tTDD, we propose false assignment pruning and random variable compaction to preserve probability calculation accuracy. To deal with the scalability issue, this paper proposes a new circuit partitioning heuristic to reduce the inaccuracy introduced by partitioning. Compared to the timed simulation results, on average our tool has a mean absolute error of 1.7% and a root mean square error of 3.9% for MCNC benchmarks and a mean absolute error of 2.2% and a root mean square error of 4.8% for ISCAS benchmarks. Compared to a state-of-the-art dynamic behavior analysis tool, our tool is 15× faster on average for MCNC benchmarks and 65× faster on average for ISCAS benchmarks, and can also handle circuits that the previous tool cannot. This dynamic behavior analyzer would enable fast and effective circuit optimizations for better-than-worst-case design.
Keywords
circuit optimisation; decision diagrams; digital circuits; logic design; mean square error methods; probability; ISCAS benchmark; better-than-worst-case design; circuit optimisation; circuit optimization; circuit partitioning heuristic; digital circuit dynamic behavior; false assignment pruning; logic optimization tool; mean absolute error; primary output; probabilistic information; random variable compaction; root mean square error; scalability issue; stabilization condition encoding; timed ternary decision diagram; voltage fluctuation; Boolean functions; Clocks; Data structures; Delay; Integrated circuit modeling; Probability; Better-than-worst-case (BTW) design; digital circuit; dynamic behavior; probability; ternary decision diagram (TDD);
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2011.2181512
Filename
6186868
Link To Document