Antiferromagnetically Coupled Patterned Media and Control of Switching Field Distribution

Author

Ranjbar, Mojtaba ; Piramanayagam, S.N. ; Suzi, Deng ; Aung, Kyaw Oo ; Sbiaa, Rachid ; Kay, Yew Seng ; Wong, Seng Kai ; Chong, Chong Tow

Author_Institution

Data Storage Inst., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore

Volume

46

Issue

6

fYear

2010

fDate

6/1/2010 12:00:00 AM

Firstpage

1787

Lastpage

1790

Abstract

Switching Field distribution (SFD) is one of the critical issues for writing in bit patterned media (BPM) for high areal densities. It is believed that the magnetostatic interaction is one of the several factors that contribute to the SFD. With the antiferromagnetically coupled (AFC) structure, the magnetostatic interaction can be tailored to understand/reduce SFD. In this study, AFC patterned media is studied with emphasis placed on the effect of the top layer coercivity, which will determine the M_r and hence the magnetostatic interaction. For this study, nanodots with a size and space of 60 and 40 nm respectively were fabricated with electron beam lithography (EBL). Remanent hysteresis curves for the nanodot arrays were obtained by counting the number of reversed dots in magnetic force microscopy (MFM) images at remanent state. The narrowest SFD at a pressure of 1 Pa for top layer was observed possibly because of good crystaline texture and reduced magnetostatic interaction.

Keywords

antiferromagnetic materials; coercive force; electron beam lithography; magnetic force microscopy; magnetic hysteresis; magnetic recording; magnetic structure; magnetic switching; magnetostatics; remanence; antiferromagnetically coupled structure; bit patterned media; coercivity; crystaline texture; electron beam lithography; magnetic force microscopy; magnetostatic interaction; nanodot arrays; pressure 1 Pa; remanent hysteresis curves; size 60 nm; switching field distribution; Antiferromagnetic materials; Automatic frequency control; Coercive force; Couplings; Electron beams; Lithography; Magnetic force microscopy; Magnetosphere; Magnetostatics; Writing; Antiferromagnetically coupled patterned media; magnetostatic interactions; switching field distribution;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2010.2043226

Filename

5467591