Title :
Pattern-Dependent Noise Predictive Soft Detection in the Post-Processor With Error Filters
Author :
Djurdjevic, Ivana ; Wilson, Bruce A. ; Oenning, Travis R.
Author_Institution :
Appl. Micro Circuits Corp., Sunnyvale, CA, USA
fDate :
6/1/2010 12:00:00 AM
Abstract :
This paper investigates a pattern-dependent noise predictive soft detection method for channel architectures that are based on a long target response and post-processing rather than a short target response and base-line wander compensation. We utilize properties of the autoregressive pattern-dependent noise model to compare tentative Viterbi sequence with alternative sequences in the post-processor and efficiently compute soft information. Even though the post-processor cannot consider all possible sequences like trellis-based detectors can, we demonstrate for a short target response that our post-processing solution does not experience any loss in performance compared to the optimal maximum a posteriori trellis-based soft detector. The complexity of the computations in the post-processor grows only linearly with the target length, as opposed to the exponential growth in complexity in trellis-based detectors. In this way we can efficiently perform nearly optimal pattern-dependent soft detection in the post-processor for a very long target response without base-line wander compensation.
Keywords :
Viterbi detection; compensation; maximum likelihood estimation; microprocessor chips; trellis codes; autoregressive pattern-dependent noise; base-line wander compensation; channel architectures; error filters; maximum a posteriori; post-processor; predictive soft detection; short target response; tentative Viterbi sequence; trellis based detectors; Circuit noise; Detectors; Filters; Gaussian noise; Magnetic noise; Maximum likelihood detection; Performance loss; Perpendicular magnetic recording; Probability distribution; Viterbi algorithm; Base-line wander compensation; pattern-dependent autoregressive noise model; perpendicular magnetic recording; post-processing; soft detection;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2010.2043227