• DocumentCode
    149974
  • Title

    Study the effect of adding new components on conventional microstrip LPF design

  • Author

    Reja, Ahmed Hameed ; Ahmad, Syed Naseem ; Mahmood, Dhari Ali

  • Author_Institution
    Univ. of Technol., Baghdad, Iraq
  • fYear
    2014
  • fDate
    5-7 March 2014
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    In this paper, Design of stepped-impedance (SI) microstrip low-pass filters (LPFs) at different cutoff frequencies are presented. A rectangular split ring resonators (SRRs), complementary split ring resonators (CSRRs), and open stubs structures are used in filter design to get better results rather than the conventional design. Low insertion loss (IL), sharp cutoff LPF, high selectivity, and reduction in size have been achieved by adding those new structures. The effect of adding new components to the conventional design have been studied and simulated by using Ansoft HFSS software. Up to 30% reduction in the size of new filters has been achieved by etching square CSRRs in the ground plane of microstrip line. The group delay values are approximately constant in pass-band interval of LPFs. The selectivity and bandwidth of stop-band after low-pass interval are studied in all designs. The filters are often used in RF circuits and microwave systems.
  • Keywords
    band-pass filters; band-stop filters; etching; low-pass filters; microstrip filters; microstrip lines; network synthesis; resonator filters; Ansoft HFSS software; IL; RF circuit; SI LPF design; SRR; complementary split ring resonator; etching square CSRR; insertion loss; microstrip line; microwave system; open stubs structure; pass-band filter; rectangular split ring resonator; sharp cutoff LPF; stepped-impedance microstrip low-pass filter; stop-band filter; Complementary split ring resonator; Low-pass filter; Microstrip; Roll off; Selectivity; Stop-band;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing for Sustainable Global Development (INDIACom), 2014 International Conference on
  • Conference_Location
    New Delhi
  • Print_ISBN
    978-93-80544-10-6
  • Type

    conf

  • DOI
    10.1109/IndiaCom.2014.6828009
  • Filename
    6828009