DocumentCode :
1499959
Title :
Inductive measurements of critical current density in superconducting thin films
Author :
Claassen, J.H.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
Volume :
25
Issue :
2
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
2233
Lastpage :
2236
Abstract :
A noncontacting method of probing the current-induced breakdown of superconductivity (i.e., Jc) in thin films is described which makes use of a single pancake coil pressed against the film surface. The technique has a sensitivity that is approximately 100 times greater than direct transport measurements using room-temperature electronics, and it eliminates many of the attendant difficulties of the latter. Preliminary results on Nb and Y-Ba-Cu-O films at 4.2 K reveal an exponential voltage-current dependence, as expected from the activated flux creep model. It is noted that, this being the case, no unique critical-current density can be defined. In the case of the oxide superconductors the flux-pinning parameters are such that even a practical Jc definition is probably not useful
Keywords :
barium compounds; critical current density (superconductivity); flux pinning; high-temperature superconductors; niobium; superconducting thin films; type II superconductors; yttrium compounds; Nb; Y-Ba-Cu-O; activated flux creep model; critical current density; current-induced breakdown; flux-pinning; high temperature superconductors; pancake coil; superconducting thin films; Critical current density; Current measurement; Density measurement; Electric breakdown; Niobium; Superconducting coils; Superconducting films; Superconducting thin films; Superconductivity; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92753
Filename :
92753
Link To Document :
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