DocumentCode :
1500100
Title :
Open Forum - Reliability Prediction and Assessment of Electronic Systems and Equipment
Author :
Cartwright, Jerry ; Donahoe, Daniel N. ; Jackson, Margaret
Author_Institution :
Honeywell-Microswitch, Freeport, IL
Volume :
22
Issue :
1
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
127
Lastpage :
128
Keywords :
Authorization; Automotive engineering; Computer architecture; Government; Hardware; Materials reliability; Military standards; Standardization; Standards development; Standards organizations;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.1999.759362
Filename :
759362
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1500100
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