Title :
Open Forum - Reliability Prediction and Assessment of Electronic Systems and Equipment
Author :
Cartwright, Jerry ; Donahoe, Daniel N. ; Jackson, Margaret
Author_Institution :
Honeywell-Microswitch, Freeport, IL
fDate :
3/1/1999 12:00:00 AM
Keywords :
Authorization; Automotive engineering; Computer architecture; Government; Hardware; Materials reliability; Military standards; Standardization; Standards development; Standards organizations;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.1999.759362