DocumentCode :
1500169
Title :
Thermal-stress analysis with electrical equivalents
Author :
Riemer, Dietrich E.
Author_Institution :
Honeywell MSD, Everett, WA, USA
Volume :
13
Issue :
1
fYear :
1990
fDate :
3/1/1990 12:00:00 AM
Firstpage :
194
Lastpage :
199
Abstract :
An electrical-equivalent method that can help to improve the conceptual understanding of thermal-stress problems is introduced. It is useful for a first-order analysis of thermal stresses in layered structures or laminates. The thermal expansion and the elasticity of each laminate layer are modeled as components in a three-terminal electrical equivalent circuit. A model of the laminate is developed by connecting the electrical equivalent circuits of the layers in a network. Currents and voltages are obtained by a network analysis. The thermal stresses in the laminate are derived from the branch currents. The local thermal expansion coefficients for the surfaces or for internally bonded interfaces are given by the node voltages
Keywords :
equivalent circuits; thermal stresses; elasticity; electrical equivalent circuit; electrical-equivalent method; internally bonded interfaces; laminates; layered structures; local thermal expansion coefficients; network analysis; node voltages; thermal expansion; thermal stress analysis; thermal stresses; thermal-stress problems; Electrical engineering; Equivalent circuits; Finite element methods; Geometry; Internal stresses; Laminates; Material properties; Thermal expansion; Thermal stresses; Voltage;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.52870
Filename :
52870
Link To Document :
بازگشت