Title :
Thin film growth of oxide superconductor materials
Author :
Henry, R.L. ; Cukauskas, E.J. ; Qadri, S.B. ; Singer, A.M. ; Campisi, G.G.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
Thin films of YBa2Cu3O7, YBa2Cu3O7:Ag and Bi2CaSr2Cu2O8 have been grown by spray pyrolysis of aqueous nitrate solutions. Substrate temperatures in the range of 300°C to 875°C have been investigated. Following deposition, the films were annealed in flowing oxygen at 960°C for YBa2Cu3O7 and 850°C for Bi2CaSr2Cu2O8. The unit cell size of YBa2Cu3O7:Ag did not change from that of YBa2Cu3O7 but the X-ray diffraction patterns for the YBa2Cu3O 7:Ag films show that the (001) reflections are greatly enhanced over all others. A Tc of 81 K with a ΔTc of 3 K has been measured for YBa2 Cu3O7:Ag films and a Tc of 74 K with ΔTc of 3 K has been measured for YBa2Cu3O7. These films were all grown on MgO substrates. The Bi2CaSr2Cu2O8 films are multiphase and have a Tc of 65 K with a very broad transition. The materials were characterized by X-ray diffractometry, scanning electron microscopy, and resistive superconducting transition measurements
Keywords :
annealing; barium compounds; bismuth compounds; calcium compounds; crystal atomic structure of inorganic compounds; high-temperature superconductors; scanning electron microscope examination of materials; silver; spray coating techniques; strontium compounds; superconducting thin films; superconducting transition temperature; yttrium compounds; (001) reflections; 300 to 875 degC; 65 K; 74 K; 81 K; 960 degC; Bi2CaSr2Cu2O8; MgO substrates; X-ray diffraction patterns; YBa2Cu3O7:Ag; annealing; aqueous nitrate solutions; broad transition; high temperature superconductors; oxide superconductor materials; resistive superconducting transition measurements; scanning electron microscopy; spray pyrolysis; substrate temperature; thin film growth; unit cell size; Annealing; Bismuth; Optical films; Spraying; Substrates; Superconducting films; Superconducting materials; Superconducting thin films; Temperature distribution; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
