Title :
Boundary layers of oxide superconductors films pasted on Al2 O3, MgO, SrTiO3 and YSZ
Author :
Agatsuma, K. ; Ohara, T. ; Kaiho, K. ; Tateishi, H.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
fDate :
3/1/1989 12:00:00 AM
Abstract :
Energy-dispersive X-ray analysis, wavelength-dispersive X-ray analysis, and scanning microscopy examinations have been performed for annealed Y-Ba-Cu-O(YBCO) and Bi-Sr-Ca-Cu-O(BSCCO) films which will be adopted for future superconducting devices. Relatively thin films pasted on various substrates and cross sections were tested. The influence of the annealing on the substrate and superconducting films has been investigated. The results show the formation of boundary layers of intermediate products, which consists of Ba compounds between the YBCO layer and substrate (Al2O3, SrTiO3, and ZrO2) and Sr and Bi compounds between the BSCCO layer and substrate (SrTiO3, MgO, and ZrO2)
Keywords :
X-ray chemical analysis; annealing; barium compounds; bismuth compounds; calcium compounds; high-temperature superconductors; strontium compounds; superconducting thin films; yttrium compounds; Al2O3; BiSrCaCuO; MgO; SrTiO3; YBaCuO; ZrO2-Y2O3; annealing; boundary layers; energy dispersive X-ray analysis; high temperature superconductors; intermediate products; scanning microscopy; superconducting films; wavelength-dispersive X-ray analysis; Annealing; Microscopy; Performance analysis; Strontium; Superconducting devices; Superconducting films; Superconducting thin films; Superconductivity; Testing; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on
