The fabrication and characterization of high temperature superconducting magnetic shields

Author

Purpura, J.W. ; Clem, T.R.

Author_Institution

US Naval Coastal Syst. Center, Panama City, FL, USA

Volume

25

Issue

2

fYear

1989

fDate

3/1/1989 12:00:00 AM

Firstpage

2506

Lastpage

2510

Abstract

Tubes fabricated of polycrystalline YBa₂Cu₃O _7-x are characterized, and details of the fabrication procedure are discussed. The microstructure of the tubes determined by scanning electron microscopy and X-ray diffractometry is described. Resistive measurements of T_c and ΔT _c have been made. The tubes have also been characterized by means of SQUID (superconducting quantum interference device) magnetometry. The temperature dependence of magnetic fields trapped axially in the tubes has been measured and estimates of penetration depth are given. Moreover, measurements of the transverse shielding effectiveness of the tubes have been made and are compared with theoretical predictions. Studies on flux penetration into the tubes are described. Findings from the microstructure studies are correlated with the observed superconductivity properties. The results on the high-temperature materials are compared to results obtained previously on tubes made from conventional superconductors

Keywords

SQUIDs; barium compounds; high-temperature superconductors; magnetometers; penetration depth (superconductivity); scanning electron microscope examination of materials; superconducting transition temperature; yttrium compounds; SQUID magnetometry; T_c; X-ray diffractometry; YBa₂Cu₃O_7-x; flux penetration; high temperature superconductors; magnetic shields; microstructure; penetration depth; scanning electron microscopy; transverse shielding effectiveness; tubes; Electron tubes; Fabrication; High temperature superconductors; Magnetic field measurement; Magnetic shielding; Microstructure; SQUIDs; Scanning electron microscopy; Superconducting devices; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92817

Filename

92817