DocumentCode :
1500624
Title :
Error Resilient Estimation and Adaptive Binary Selection for Fast and Reliable Identification of RFID Tags in Error-Prone Channel
Author :
Park, Jongho ; Lee, Tae-Jin
Author_Institution :
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
Volume :
11
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
959
Lastpage :
969
Abstract :
In RFID systems, far field passive tags send information using back scattering. The signal level is typically very small, so channel error during transmission may occur frequently. Due to channel error, performance of RFID tag identification under error-prone channel is degraded compared to that under error-free channel. In this paper, we propose a novel error resilient estimation and adaptive binary selection to overcome the problem of channel errors. Our proposed error resilient estimation algorithm can estimate the number of tags and the channel state accurately regardless of frame errors. And our proposed adaptive binary selection reduces the idle slots caused by frame errors. Performance analysis and simulation results show that the proposed algorithm consumes up to 20 percent less time slots than the binary tree protocol and dynamic framed slotted ALOHA (DFSA) in various packet error rate (PER) conditions.
Keywords :
access protocols; radiofrequency identification; telecommunication channels; telecommunication network reliability; DFSA; PER; RFID systems; RFID tags; adaptive binary selection; back scattering; dynamic framed slotted ALOHA; error resilient estimation; error-prone channel; far field passive tags; fast identification; packet error rate; performance analysis; radio frequency identification; reliable identification; Algorithm design and analysis; Binary trees; Channel estimation; Estimation; Protocols; Radiation detectors; Radiofrequency identification; Anticollision; RFID; channel error; collision resolution; tag estimation.;
fLanguage :
English
Journal_Title :
Mobile Computing, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-1233
Type :
jour
DOI :
10.1109/TMC.2011.112
Filename :
6188340
Link To Document :
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