Title :
Properties of in-situ superconducting thin films of Y-Ba-Cu-O on Si, Al2O3, and SrTiO3 substrates
Author :
Silver, R.M. ; Berezin, A.B. ; Ogawa, E. ; de Lozanne, A.L.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
The authors report on the as-deposited superconducting properties and microstructure of YBa2Cu3O7-y thin films grown on Si, Al2O3 and SrTiO3 (110) and (100). They deposited thin films of YBa2Cu3 O7-y, which have critical temperatures as high as 68 K, directly on Si. They also grew in situ superconducting films on SrTiO 3 (110) with critical temperatures of 84.5 K and critical currents typically around 1×106 A/cm2 at 4.2 K. Transmission electron microscopy and X-ray diffraction studies showed that the films have a single orientation and no grain boundaries
Keywords :
barium compounds; critical currents; high-temperature superconductors; superconducting thin films; superconducting transition temperature; surface structure; transmission electron microscope examination of materials; yttrium compounds; 68 K; 84.5 K; Al2O3; Si; SrTiO3; X-ray diffraction; YBa2Cu3O7-y; critical currents; critical temperatures; high temperature superconductors; microstructure; superconducting properties; thin films; transmission electron microscopy; Critical current; Microstructure; Semiconductor thin films; Sputtering; Superconducting films; Superconducting thin films; Temperature; Transmission electron microscopy; X-ray diffraction; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on
