Title :
Magnetic properties and microstructure of sintered high-Tc Bi-Sr-Ca-Cu-O and Tl-Ba-Ca-Cu-O oxides
Author :
Kumakura, H. ; Togano, K. ; Uehara, M. ; Maeda, H. ; Takahashi, K. ; Nakao, M.
Author_Institution :
Nat. Res. Inst. of Metals, Ibaraki, Japan
fDate :
3/1/1989 12:00:00 AM
Abstract :
AC complex susceptibility χ\´-iχ", DC magnetization, resistive transition curves in various magnetic fields, and the critical-current density were measured for sintered Bi-Sr-Ca-Cu-O and Tl-Ba-Ca-Cu-O samples whose major phase was the high- Tc phase of each system. The single peak observed in χ" vs. temperature curves was very sharp for both samples of each system. The hysteresis in DC magnetization curves at 77 K rapidly decreased with increasing magnetic field for both systems. This may be related to the layered morphology of the platelike grains. The resistive transition curves of both samples were broadened by the application of a magnetic field as in the case of Y1Ba2Cu3 O7. In magnetic fields, rather long tails to low temperatures were observed in resistive transition curves for Bi-Sr-Ca-Cu-O. Jcs at 77 K and zero field were 250 A/cm2 and 600 A/cm2 for Bi- and Tl-based samples, respectively. These Jcs rapidly decreased with increasing magnetic field
Keywords :
barium compounds; bismuth compounds; calcium compounds; critical current density (superconductivity); crystal microstructure; high-temperature superconductors; magnetic hysteresis; magnetic susceptibility; magnetisation; strontium compounds; thallium compounds; 77 K; AC complex susceptibility; Bi-Sr-Ca-Cu-O; DC magnetization; Tl-Ba-Ca-Cu-O; critical-current density; high temperature superconductivity; high-Tc phase; hysteresis; layered morphology; magnetic field effects; microstructure; platelike grains; resistive transition curves; sintered oxides; Density measurement; Magnetic field measurement; Magnetic fields; Magnetic hysteresis; Magnetic properties; Magnetic susceptibility; Magnetization; Microstructure; Phase measurement; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on