DocumentCode
1500889
Title
Electronic noise in Ba2YCu3O7 films at high temperatures: a possible connection to stress relaxation
Author
Davidson, A. ; Pedersen, N.F. ; Palevski, A. ; Scheuermann, M.R.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
25
Issue
2
fYear
1989
fDate
3/1/1989 12:00:00 AM
Firstpage
2230
Lastpage
2232
Abstract
Two types of electronic noise have been observed in Ba2YCu3O7 at high temperature. One type is probably due to temperature and pressure fluctuations in the environment of the sample. Because of the known sensitivity of Ba2 YCu3O7 resistance to both temperature and pressure, this mechanism translates into 10 to 100 nV per root Hz of noise at temperatures above 750 K. The second type is more intrinsic, and may be related to stress relaxation in the film induced by the structural changes associated with the orthorhombic-tetragonal transition near 950 K
Keywords
barium compounds; high-temperature superconductors; internal stresses; noise; solid-state phase transformations; superconducting thin films; yttrium compounds; Ba2YCu3O7; electronic noise; high temperature superconductors; orthorhombic-tetragonal transition; stress relaxation; Atmosphere; Background noise; Bandwidth; Fluctuations; Noise figure; Noise measurement; Temperature; Thermal stresses; Voltage; Working environment noise;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.92849
Filename
92849
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